SHRIMP II
The Sensitive High Resolution Ion Micro Probe II

SHRIMP II

The Sensitive High Resolution Ion Micro Probe (SHRIMP) IIe is a high precision Secondary Ion Mass Spectrometer (SIMS). Ion microprobes make in situ isotopic and chemical 'surface' analysis of solid targets by bombarding the sample with an ion beam with a diameter of several microns typically employing Kohler focussing. The high mass resolution of SHRIMP IIe is achieved by the use of double-focussing mass spectrometer (simultaneous energy and mass refocussing) with a very large turning radius of Magnet and Electrostatic Analyser. SHRIMP has many applications: zircon dating in copper-uranium-gold-silver deposits, uranium-lead dating of sulphur in the sulphide minerals that form metal ores, the isotopic composition of sulphur in the giant base metal ore bodies.

With the addition of an optional cesium gun rather than the standard duoplasmatron, the SHRIMP IIe excels in the analysis of oxygen. Analysis of non-conductive samples is assisted with the optional electron gun for charge neutralisation.

  • Versatile

    • Geochronology
    • Stable Isotopes
    • Trace Elements

  • Flexible

    • Single or Multi-collector
    • Charge Neutralisation with electron gun
    • Positive or Negative Ion Modes
    • Duoplasmatron (oxygen, argon) or Cesium Gun

  • Reliable

    • Setting the standard for U-Pb micro-geochronology
    • First to date the oldest rock
    • First to date the oldest minerals
    • Still the record holder for oldest ages

  • Accurate

    • Setting the standard for U-Pb micro-geochronology
    • First to date the oldest rock
    • First to date the oldest minerals
    • Still the record holder for oldest ages

  • Advanced

    • Automated Stand-alone Operation
    • Rapid Sample Screening Capability
    • Remote Operation and Diagnosis via the web
    • Backed by Ongoing R&D from the ANU


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